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(Reference retrieved automatically from Web of Science through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Molecular beam epitaxy of antiferromagnetic (MnBi2Te4)(Bi2Te3) thin films on BaF2 (111)

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Author(s):
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Kagerer, P. [1, 2, 3] ; Fornari, C. I. [1, 2, 3] ; Buchberger, S. [1, 2, 3] ; Morelhao, S. L. [4] ; Vidal, R. C. [1, 2, 3] ; Tcakaev, A. [5] ; Zabolotnyy, V. [5] ; Weschke, E. [6] ; Hinkov, V. [5] ; Kamp, M. [7, 8] ; Buechner, B. [9, 2, 3, 10] ; Isaeva, A. [2, 3, 10, 9] ; Bentmann, H. [1, 2, 3] ; Reinert, F. [1, 2, 3]
Total Authors: 14
Affiliation:
[1] Univ Wurzburg, Expt Phys 7, D-97074 Wurzburg - Germany
[2] Wurzburg Dresden Cluster Excellence Ctqmat, D-97074 Wurzburg - Germany
[3] Wurzburg Dresden Cluster Excellence Ctqmat, D-01062 Dresden - Germany
[4] Univ Sao Paulo, Inst Fis, BR-05508090 Sao Paulo, SP - Brazil
[5] Univ Wurzburg, Expt Phys 4, D-97074 Wurzburg - Germany
[6] Helmholtz Zentrum Berlin Mat & Energie, Albert Einstein Str 15, D-12489 Berlin - Germany
[7] Univ Wurzburg, Phys Inst, D-97074 Wurzburg - Germany
[8] Univ Wurzburg, Fak Phys & Astron, Rontgen Ctr Complex Mat Syst RCCM, D-97074 Wurzburg - Germany
[9] Tech Univ Dresden, Inst Festkorper & Mat Phys, D-01062 Dresden - Germany
[10] Leibniz IFW Dresden, Helmholtzstr 20, D-01069 Dresden - Germany
Total Affiliations: 10
Document type: Journal article
Source: Journal of Applied Physics; v. 128, n. 13 OCT 7 2020.
Web of Science Citations: 1
Abstract

The layered van der Waals compounds ( MnBi 2 Te 4)( Bi 2 Te 3) were recently established as the first intrinsic magnetic topological insulators. We report a study on the epitaxial growth of ( MnBi 2 Te 4 ) m ( Bi 2 Te 3 ) n films based on the co-deposition of MnTe and Bi 2 Te 3 on BaF 2 (111) substrates. X-ray diffraction and scanning transmission electron microscopy evidence the formation of multilayers of stacked MnBi 2 Te 4 septuple layers and Bi 2 Te 3 quintuple layers with a predominance of MnBi 2 Te 4. The elemental composition and morphology of the films is further characterized by x-ray photoemission spectroscopy and atomic force microscopy. X-ray magnetic circular and linear dichroism spectra are comparable to those obtained for MnBi 2 Te 4 single crystals and confirm antiferromagnetic order in the films. (AU)

FAPESP's process: 19/01946-1 - X-ray diffraction and scattering in materials: advanced methods II
Grantee:Sérgio Luiz Morelhão
Support type: Regular Research Grants