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(Reference retrieved automatically from Web of Science through information on FAPESP grant and its corresponding number as mentioned in the publication by the authors.)

Elemental mapping of large samples by external ion beam analysis with sub-millimeter resolution and its applications

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Author(s):
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Silva, T. F. [1] ; Rodrigues, C. L. [1] ; Added, N. [1] ; Rizzutto, M. A. [1] ; Tabacniks, M. H. [1] ; Mangiarotti, A. [1] ; Curado, J. F. [2] ; Aguirre, F. R. [1] ; Aguero, N. F. [1] ; Allegro, P. R. P. [1] ; Campos, P. H. O. V. [1] ; Restrepo, J. M. [1] ; Trindade, G. F. [3] ; Antonio, M. R. [1] ; Assis, R. F. [1] ; Leite, A. R. [1]
Total Authors: 16
Affiliation:
[1] Univ Sao Paulo, Inst Fis, Rua Matao, Trav R 187, BR-05508090 Sao Paulo - Brazil
[2] Ctr Univ FEI, Av Humberto de Alencar Castelo Branco, BR-09850901 Sao Bernardo Do Campo, SP - Brazil
[3] Univ Surrey, Dept Mech Engn Sci, Surface Anal Lab, Guildford GU2 7XH, Surrey - England
Total Affiliations: 3
Document type: Journal article
Source: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIO; v. 422, p. 68-77, MAY 1 2018.
Web of Science Citations: 2
Abstract

The elemental mapping of large areas using ion beam techniques is a desired capability for several scientific communities, involved on topics ranging from geoscience to cultural heritage. Usually, the constraints for large-area mapping are not met in setups employing micro- and nano-probes implemented all over the world. A novel setup for snapping large sized samples in an external beam was recently built at the University of Sao Paulo employing a broad MeV-proton probe with sub-millimeter dimension, coupled to a high-precision large range XYZ robotic stage (60 cm range In all axis and precision of 5 mu m ensured by optical sensors). An important issue on large area mapping is how to deal with the irregularities of the sample's surface, that may introduce artifacts in the images due to the variation of the measuring conditions. In our setup, we implemented an automatic system based on machine vision to correct the position of the sample to compensate for its surface irregularities. As an additional benefit, a 3D digital reconstruction of the scanned surface can also be obtained. Using this new and unique setup, we have produced large-area elemental maps of ceramics, stones, fossils, and other sort of samples. (AU)

FAPESP's process: 13/19976-8 - Characterization of cultural heritage materials using non destructive ion beam analysis
Grantee:Paula Rangel Pestana Allegro
Support type: Scholarships in Brazil - Post-Doctorate
FAPESP's process: 12/00202-0 - Scientific research in the São Paulo museums
Grantee:Márcia de Almeida Rizzutto
Support type: Regular Research Grants