Scholarship 15/26391-1 - Nanosensores, Nanotecnologia - BV FAPESP
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Synthesis and characterization of pure and doped SnO2 nanowires for nanodevices applications

Grant number: 15/26391-1
Support Opportunities:Scholarships abroad - Research
Start date until: April 01, 2016
End date until: February 28, 2017
Field of knowledge:Engineering - Materials and Metallurgical Engineering - Nonmetallic Materials
Principal Investigator:ALEXANDRE JOSÉ DE CASTRO LANFREDI
Grantee:ALEXANDRE JOSÉ DE CASTRO LANFREDI
Host Investigator: Prof Srp Silva
Host Institution: Centro de Engenharia, Modelagem e Ciências Sociais Aplicadas (CECS). Universidade Federal do ABC (UFABC). Ministério da Educação (Brasil). Santo André , SP, Brazil
Institution abroad: University of Surrey, England  

Abstract

The synthesis and development of devices from one-dimensional 1D material have allowed observing a number of new physical phenomena and create new technological applications as well as provide subsidies for the understanding and explanation of these phenomena. This project proposes to study nanostructured materials based on nanowires of tin oxide (SnO2) pure or doped with Indium (ITO), Zinc (ZTO) or Germanium (GTO), which will be synthesized by using the Vapor-liquid-solid (VLS) and Vapor-solid (VS) growth techniques. The synthesis of these nanoparticles by chemical deposition techniques in the vapor phase will be conducted in highly controlled deposition chambers. The doping will occur during the synthesis or by ionic implantation. By using electron-beam and ion-beam scanning microscopy with nano-manipulators and nanolithography techniques, intends to improve the preparation of nanodevices in order to study the physical properties of such low-dimensional electronic systems. In this context, the chemical analysis of such materials will be carry out by X-ray dispersive energy spectroscopy with nanometric resolution and by ion-beam mass spectroscopy. For nanoscale morphological analysis, in addition to scanning and transmission electronic microscopies, the ultra-high vacuum probe scanning technology will be employed in order to evaluate the atomic scale images and provide a precise chemical analysis and electronic properties of the surface. Further electronic analysis will be conducted by resistivity 4-probe measurements and electrical and optical spectroscopy.

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