Light interference in semiconductor devices applied to measurements and performances analysis (LISA)

Abstract

Active and passive semiconductor photonics devices are widely used to generate and to process light, in medical applications, in material characterization, in optical communication, nonlinear and quantum optics experiments. An important specification for the devices is the scattering losses. Coherent light propagating in wave guiding structure can be strongly impacted by the defects induced by the technological processes and can reduce the expected performances. Improving a non-destructive technique developed at the University of Denis- Diderot (Paris 7 - France) with the last generation of telecommunication components I propose to re-implement at the Federal University in São Carlos (UFSCar) a non-expensive and user-friendly technique both for low loss characterization of passive photonics devices (Mach-Zehnder, interferometer, waveguide for nonlinear optics, nanowire) and time-resolved thermal characterization in optoelectronic components (quantum well lasers, quantum dot lasers, quantum cascade lasers) with maximal spatial two-dimensional resolution of 2 ¼m at the state of the art and time resolution depending on the detector speed. The characterization setup can implement both the measurement techniques based on Fabry-Pérot properties of a cavity. Concerning the active devices the thermal heating strongly influences the lifetime and operation parameters. This optical bench supported last year the technological development of a quantum cascade laser in an international worldwide known private research company. Academic and private interest on this kind of approach is a key point in this project especially considering my relationship with private research institutions (Telecom Italia, Agilent Technologies, Avago Technologies and Thales France). (AU)