Research Grants 13/24461-7 - Semicondutores, Propriedades elétricas - BV FAPESP
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Influence of the atmosphere control on the performance of thin-film transistors for applications in Flexible/Transparent circuitry

Abstract

This project proposal aims to study the effect of atmosphere control in the performance of thin-film transistors (TFTs) with the active layer comprised by organic semiconductors or by solution-processed metal-oxide semiconductors. The exposure of the active layer of organic field-effect transistors (OFETs) to oxygen and light causes a displacement in the threshold voltage and the off-current which, depending on the polarization condition of the electrodes, severely lowers the device overall performance. This effect is related to the formation of charge-carrier traps due to a reversible photo-oxidation process of the organic semiconductor. On the other hand, metal-oxide semiconducting films used in transparent TFTs show a huge variation in the conductivity and in the charge-carrier mobility on time when stored in inert atmosphere, causing an enormous instability on the operation of this kind of device, which is an undesirable effect for technological applications. The current project proposes a methodology to carry out a thorough study of the electrical behavior of OFETs and semiconducting oxides TFTs as a function of the exposure to the ambient atmosphere, specially to the oxygen concentration. We expect to be able to describe qualitatively and quantitatively the role of oxygen in the device operating mechanism and how the dynamics of the diffusion process in the active layer depends on parameters like temperature and time. (AU)

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Scientific publications (8)
(References retrieved automatically from Web of Science and SciELO through information on FAPESP grants and their corresponding numbers as mentioned in the publications by the authors)
AMORIM, CLEBER A.; GOZZI, GIOVANI; CHINAGLIA, DANTE L.; DOS SANTOS, FRANCISCO JOSE; SANTOS, LUCAS FUGIKAWA. Synthesis of Transparent Semiconducting Metal-oxides via Polymeric Precursor Route for Application in Thin-film Field-Effect Transistors. MRS ADVANCES, v. 1, n. 7, p. 489-494, . (08/57706-4, 13/24461-7)
GOZZI, G.; CAGNANI, L. D.; FARIA, R. M.; SANTOS, L. F.. Electrical properties of electrochemically doped organic semiconductors using light-emitting electrochemical cells. Journal of Solid State Electrochemistry, v. 20, n. 8, p. 2127-2133, . (08/57706-4, 13/24461-7)
CANTUARIA, JOSE BRUNO; GOZZI, GIOVANI; SANTOS, LUCAS FUGIKAWA. On the UV-light-induced Desorption/Adsorption Mechanism of Atmospheric Species in Solution-processed Zinc Oxide Thin Films. MRS ADVANCES, v. 4, n. 2, p. 111-117, . (13/24461-7, 18/18617-8, 08/57706-4, 14/50869-6)
MARTINS, DENIS E.; GOZZI, GIOVANI; SANTOS, LUCAS FUGIKAWA. Influence of spray-pyrolysis deposition parameters on the electrical properties of aluminium zinc oxides thin films. MRS ADVANCES, v. 3, n. 5, p. 283-289, . (08/57706-4, 17/22018-0, 13/24461-7)
BRAGA, JOAO P.; MOISES, LUCAS A.; GOZZI, GIOVANI; FUGIKAWA-SANTOS, LUCAS. Prediction of the electrical response of solution-processed thin-film transistors using multifactorial analysis. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v. 30, n. 18, SI, p. 16939-16948, . (13/24461-7, 14/50869-6)
DE LIMA, GUILHERME R.; BRAGA, JOAO PAULO; GOZZI, GIOVANI; SANTOS, LUCAS FUGIKAWA. Optimization of the Electrical Performance of Metal Oxide Thin-film Transistors by varying Spray Deposition Parameters. MRS ADVANCES, v. 3, n. 5, p. 247-253, . (13/24461-7, 08/57706-4, 17/22018-0)
GALINDO, LEVY A.; GOZZI, GIOVANI; FUGIKAWA-SANTOS, LUCAS; FARIA, ROBERTO M.; LAVARDA, FRANCISCO C.; BATAGIN-NETO, AUGUSTO. Investigation of the polymer-salt interactions in polymeric light emitting electrochemical cells: Electronic structure calculations and experimental studies. ORGANIC ELECTRONICS, v. 79, . (13/24461-7, 14/20410-1)
BRAGA, JOAO P.; MOISES, LUCAS A.; GOZZI, GIOVANI; FUGIKAWA-SANTOS, LUCAS. Prediction of the electrical response of solution-processed thin-film transistors using multifactorial analysis. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, v. 30, n. 18, p. 10-pg., . (13/24461-7, 14/50869-6)

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