Scientific MUE: acquisition of integrated transmission and dual beam (focused ion ...
EMU: acquisition of a transmission electron microscope for single particle cryo el...
EMU scientific: acquisition of triple beam electron microscope coupled with automa...
Advanced characterization through TEM of FIB prepared samples of nanocrystalline a...
An In-Depth Analysis of Hydrogen Embrittlement Mechanisms in Titanium Alloys Using...
Study and characterization of phase formation and stability in an AlCoCrFeNiB0.1 h...
Scientific MUE: acquisition of a MEV-FEG scanning electron microscope with serial ...